Dielectric Materials

Any application that uses or generates electrical power is ultimately going to require some form of insulation. High voltage power supplies and distribution devices often require vacuum, insulative hydrocarbons, or ceramic interrupts to control the significant power generated. On the other end of the scale, semi-conductor devices often require much more limited insulation, and can often benefit from semi-insulative dielectrics. The application and design of the dielectric materials can often be made difficult because of the mismatch between the dielectric and the hard metal conductive elements. Tight spatial control of these materials can often make the difference between clean signals and partially functioning devices. For the scientists and engineers in this realm of we provide analysis for root cause or failure mode, and determination of the extent of damage to devices both large and small.

 

EMSL offers a suite of comprehensive tests to assist electrical engineering professionals at both ends of the electrical power spectrum. EMSL offers testing for leakage and eddy current in bulk insulators, as well as capabilities to probe micro-electronics for functional performance. With advanced micro-analysis capabilities and trace chemical analysis, breakdowns in ceramics, polymers, and other hydrocarbons can be examined, not only from the perspective of damage to the dielectric, but also by charting the damage to adjacent conductive elements. Using CSAM or X-ray CT, the layout and consistency of dielectrics in devices can be non-destructively examined. FTIR microscopy and micro-Raman can detail slight changes and oxidation in polymers and on ceramic surfaces.

 

With our years of experience in assisting engineers with design challenges and failure investigation, EMSL can offer a comprehensive suite of tools to assist companies with evolving problems. From High-K dielectrics in a transistor structure, through arcs created in megawatt power switching networks, EMSL can offer assistance with your problems today.

 

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